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Peng, C. Y. and Tseng, S. T.* (2010). “Progressive-stress accelerated degradation test for highly-reliable products.” To appear in IEEE Transactions on Reliability, NSC-96-2628-M-007-014-MY3, (SCI).
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Tseng, S. T.*, Jou, B. Y. and Liao, C. H. (2010), “Adaptive variable EWMA controller for drifted processes.” To appear in IIE Transactions (Focus on Quality and Reliability Engineering), (SCI).
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Tseng, S. T.*, N. Balakrishnan and Tsai, C. C. (2009), “Optimal step-stress accelerated degradation test plan for Gamma process.” IEEE Transactions on Reliability, 58(4), 611-618, NSC-96-2628-M-007-014-MY3, (SCI).
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Peng, C. Y. and Tseng, S. T.* (2009). “Mis-specification analysis of linear degradation models.” IEEE Transactions on Reliability, 58(3), 444-455, NSC-96-2628-M-007-014-MY3, (SCI).
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Tseng, S. T.* and Jou, B. Y. (2009), “A technical note on sample size determination for achieving the stability of double multivariate exponentially weighted moving average controller.” Technometrics, 51(3), 335-338. NSC-97-2221-E-007-096-MY3, (SCI).
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Jou, B.Y. and Tseng, S. T.* (2009), “An enhanced double MEWMA controller for drifted MIMO system.” Communications in Statistics-Theory and Methods. 38(10), 1730-1740, NSC-96-2221-E-007-038-MY3, (SCI) .
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Tseng, S. T.*, and Lin, C. H. (2009), “Stability analysis of single EWMA controller under dynamic models.” IIE Transactions (Focus on Quality and Reliability Engineering), 41(7), 654-663. (SCI).
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Wu, M. F., Lin, C. H., Wong, S. H., Jang, S. S., and Tseng, S. T. (2008), “Performance analysis of EWMA controllers subject to metrology delay.” IEEE Transactions on Semiconductor Manufacturing, 21(3), 413-425, (SCI).
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Lee, S. P., Chou, R. J. and Tseng, S. T. (2008), “Stability and performance of double MEWMA controller for drifted MIMO systems.” To appear in IIE Transactions.
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Tseng, S. T. and Tang, J. and Lin, C-H. (2007), “Sample size determination for achieving the stability of double multivariate exponentially weighted moving average controller.” Technometrics, 49(4), 409-419.
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Tseng, S. T. and Peng, C. Y. (2007), “Stochastic diffusion modeling of degradation data.” Journal of Data Science, 5(3), 315-335.
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Tseng, S. T. and Tsung, F. and Liu, P-Y. (2007), “Variable EWMA run-to-run controller for a drift process.” IIE Transactions, 39, 291-301.
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Liao, C. M. and Tseng, S. T.* (2006), “Optimal design for step-stress accelerated degradation tests.” IEEE Transactions on Reliability, 55(1), 59-66, NSC 87-2218-M-007-007, (SCI).
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Tseng, S. T.*, Song, W. M., and Chang, Y. C. (2005), “An initial intercept iteratively adjusted (IIIA) controller.” IEEE Transactions on Semiconductor Manufacturing, 18(3), 448-457, NSC 89-2218-M-007-018, (SCI).
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Tseng, S. T.*, and Hsu, N. J. (2005), “Sample size determination for achieving the asymptotic stability of dEWMA controller.” IEEE Transactions on Semiconductor Manufacturing, 18(1), 104-111, NSC 92-2213-E-007-066, (SCI).
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Tseng, S. T.* and Peng, C. Y. (2004), “Optimal burn-in policy by using integrated Wiener process.” IIE Transactions (Focus on Quality and Reliability Engineering), 36, 1161-1170, NSC 91-2213-E-007-081, (SCI).
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曾勝滄*、彭健育及劉家銘 (2004), 「非線性隨機衰變模型之最適設計」, 中國統計學報第 42 卷第2期,頁數 115-130, (Invited paper on the celebration of Dr. M. T. Chao's retirement).
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Yu, H. F. and Tseng, S. T.* (2004), “Designing degradation experiment with a reciprocal Weibull degradation Rate.” Journal of Quality Technology and Quantitative Methods, 1(1), 47-63.
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Tseng, S, T.*, Yeh, A. B., Tsung, F., Chan, I. Y. (2003), “A study of variable EWMA controller.” IEEE Transactions on Semiconductor Manufacturing, 16(4), 633-643. NSC 90-2218-M-007-009, (SCI).
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Tseng, S. T.*, Tang, J., and Ku, I. H. (2003), “Determination of burn-in parameters and residual life assessment of highly reliable products.” Naval Research Logistics, 50(1), 1-14. NSC-87-2213-007-053, (SCI).
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Tseng, S. T.*, Chou, R. J., and Lee, S. P. (2002a), “A study of multivariate EWMA controller.” IIE Transactions, 34(6), 541-549, NSC 88-2218-M-007-007, (SCI).
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Tseng, S. T.*, Chou, R. J., and Lee, S. P. (2002b), “Statistical design of double EWMA controller.” Applied Stochastic Models in Business and Industry, 18(3), 313-322. NSC 89-2218-M-007-018, (SCI).
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Yu, H. F., and Tseng, S. T.* (2002), "Designing a screening experiment for highly reliable products." Naval Research Logistics, 49(5), 514-526, NSC 89-2218-M-007-019, (SCI).
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Tseng, S. T.*, and Tang, J. (2001), "Optimal burn-in time for highly reliable products." International Journal of Industrial Engineering, 8(4), 329-338, NSC-87-2213-007-053, (SCI).
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Tseng, S. T.*, and Wen, Z. C. (2000), "Step-stress accelerated degradation analysis of highly reliable products." Journal of Quality of Technology, 32(3), 209-216. NSC 87-2218-M-007-007, (SCI).
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Tseng, S. T. (2009), “Optimal step-stress accelerated degradation test for gamma process”, MMR2009, Moscow, June 22-27, Russia.
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Tseng, S. T. (2008), “Designing an efficient MEWMA controller”, ISBIS 2008, Prague, July 1-4.
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Tseng, S. T. (2007), “Model mis-specification Analysis of Linear Degradation Models,” 56nd ISI International Conference, Lison, Portugal, August 22-29.
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Tseng, S. T. (2006), “Stability Analysis of Single EWMA controller under Dynamic Systems,” INFORMS Meeting, Hong-Kong, June 25-28.
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Tseng, S. T. (2005), “Determination the Sample Size for Achieving Stability of Double MEWMA Controller,” CSPS and IMS Joint Meeting, Beijing, July 9-12.
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Tseng, S. T. (2004), "Reliability Improvement via Degradation Experiment," MMR2004 Conference, Santa Fe, USA, June 21-24.
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Tseng, S. T. (2003), "An Enhanced Double EWMA Control Scheme," 54nd ISI International Conference, Berlin, Germany, August 13-20.
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Tseng, S. T. (2003), "Optimal Variable EWMA Controller for a Drifted Process," 3nd International Symposium of Industrial Statistics, Barcelona, Spain, August 21-22.
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Tseng, S. T. and Peng, C. Y. (2002), "Optimal burn-in time via stochastic integral" International Conference on Ranking and Selection, Multiple Comparisons, Reliability, and their Applications, Chennai, India, Dec. 28-30.
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Yu, H. F. and Tseng, S. T.(2001), "Designing a screening experiment for highly reliable products," ISI International Conference, Seoul, Korea, August 23-28.
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Tseng, S. T., Chou, R. J. and Lee, S. P. (2001), "Stability analysis of double EWMA controller," 2nd International Symposium of Industrial Statistics, Yokoyama, Japan, August,20-21.
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Sun, C. I., Lee, S. P., Tseng, S. T., and Lo, Y. C. (2001), "Run by run feedback control for multiple products and multiple tools," 2nd International Symposium Industrial Statistics, Yokoyama, Japan, August,20-21.
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Tseng, S. T. (2000), "Optimal burn-in procedure for highly-reliable products," 2nd International Conference of Mathematical methods of Reliability Theory, Bordeaux, France.