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Sheng-Tsaing Tseng

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Name：Sheng-Tsaing Tseng
Position：Retired Professor Professor
Degree：Ph.D., Management Science, Tamkang University , Taiwan
Research Interests：Reliability Analysis、Quality Management
Office：Room 830, General Building III，ext.：33180
Email：Email

 

Education

  • Post Doc., Statistics, Stanford University, 1984-1985
  • Ph. D., Management Sciences, Tamkang University, 1979-1982
  • M. Sc., Applied Mathematics, Tsing-Hua University, 1975-1977
  • B. Sc., Business Mathematics, Soochow University, 1971-1975

 

Professional Experiences

  • Professor, National Tsing-Hua University, 1995/08~
  • Director, National Tsing-Hua University, 1998/08~2000/07
  • Professor, National Taiwan Institute of Technology, 1989/08~1995/07
  • Associate Professor, National Taiwan Institute of Technology, 1983/02~1989/07
  • Lecture, National Taiwan Institute of Technology, 1982/08~1983/01
  • Lecturer, Soochow University, 1977/08~1982/07

 

Research Interests

  • Reliability Analysis、SPC and Run-to-run Process Control、Design of Experiment (DOE) and Taguchi Method
     
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Teaching

 

Publications

　　A. 期刊論文 (Journal Papers)

  • Peng, C. Y. and Tseng, S. T.* (2010). “Progressive-stress accelerated degradation test for highly-reliable products.” To appear in IEEE Transactions on Reliability, NSC-96-2628-M-007-014-MY3, (SCI).
  • Tseng, S. T.*, Jou, B. Y. and Liao, C. H. (2010), “Adaptive variable EWMA controller for drifted processes.” To appear in IIE Transactions (Focus on Quality and Reliability Engineering), (SCI).
  • Tseng, S. T.*, N. Balakrishnan and Tsai, C. C.  (2009), “Optimal step-stress accelerated degradation test plan for Gamma process.” IEEE Transactions on Reliability, 58(4), 611-618, NSC-96-2628-M-007-014-MY3, (SCI).
  • Peng, C. Y. and Tseng, S. T.* (2009). “Mis-specification analysis of linear degradation models.” IEEE Transactions on Reliability, 58(3), 444-455, NSC-96-2628-M-007-014-MY3, (SCI).
  • Tseng, S. T.* and Jou, B. Y. (2009), “A technical note on sample size determination for achieving the stability of double multivariate exponentially weighted moving average controller.” Technometrics, 51(3), 335-338. NSC-97-2221-E-007-096-MY3, (SCI).
  • Jou, B.Y. and Tseng, S. T.* (2009), “An enhanced double MEWMA controller for drifted MIMO system.” Communications in Statistics-Theory and Methods. 38(10), 1730-1740, NSC-96-2221-E-007-038-MY3, (SCI) .
  • Tseng, S. T.*, and Lin, C. H. (2009), “Stability analysis of single EWMA controller under dynamic models.” IIE Transactions (Focus on Quality and Reliability Engineering), 41(7), 654-663. (SCI).
  • Wu, M. F., Lin, C. H., Wong, S. H., Jang, S. S., and Tseng, S. T. (2008), “Performance analysis of EWMA controllers subject to metrology delay.” IEEE Transactions on Semiconductor Manufacturing, 21(3), 413-425, (SCI).
  • Lee, S. P., Chou, R. J. and Tseng, S. T. (2008), “Stability and performance of double MEWMA controller for drifted MIMO systems.” To appear in IIE Transactions.
  • Tseng, S. T. and Tang, J. and Lin, C-H. (2007), “Sample size determination for achieving the stability of double multivariate exponentially weighted moving average controller.” Technometrics, 49(4), 409-419.
  • Tseng, S. T. and Peng, C. Y. (2007),  “Stochastic diffusion modeling of degradation data.” Journal of Data Science, 5(3), 315-335.
  • Tseng, S. T. and Tsung, F. and Liu, P-Y. (2007), “Variable EWMA run-to-run controller for a drift process.” IIE Transactions, 39, 291-301.
  • Liao, C. M. and Tseng, S. T.* (2006), “Optimal design for step-stress accelerated degradation tests.” IEEE Transactions on Reliability, 55(1), 59-66, NSC 87-2218-M-007-007, (SCI).
  • Tseng, S. T.*, Song, W. M., and Chang, Y. C. (2005), “An initial intercept iteratively adjusted (IIIA) controller.” IEEE Transactions on Semiconductor Manufacturing, 18(3), 448-457, NSC 89-2218-M-007-018, (SCI).
  • Tseng, S. T.*, and Hsu, N. J. (2005), “Sample size determination for achieving the asymptotic stability of dEWMA controller.” IEEE Transactions on Semiconductor Manufacturing, 18(1), 104-111, NSC 92-2213-E-007-066, (SCI).
  • Tseng, S. T.* and Peng, C. Y. (2004), “Optimal burn-in policy by using integrated Wiener process.” IIE Transactions (Focus on Quality and Reliability Engineering), 36, 1161-1170, NSC 91-2213-E-007-081, (SCI).
  • 曾勝滄*、彭健育及劉家銘 (2004), 「非線性隨機衰變模型之最適設計」, 中國統計學報第 42 卷第2期,頁數 115-130, (Invited paper on the celebration of Dr. M. T. Chao's retirement).
  • Yu, H. F. and Tseng, S. T.* (2004), “Designing degradation experiment with a reciprocal Weibull degradation Rate.” Journal of Quality Technology and Quantitative Methods, 1(1), 47-63.
  • Tseng, S, T.*, Yeh, A. B., Tsung, F., Chan, I. Y. (2003), “A study of variable EWMA controller.” IEEE Transactions on Semiconductor Manufacturing, 16(4), 633-643. NSC 90-2218-M-007-009, (SCI).  
  • Tseng, S. T.*, Tang, J., and Ku, I. H. (2003), “Determination of burn-in parameters and residual life assessment of highly reliable products.”  Naval Research Logistics, 50(1), 1-14. NSC-87-2213-007-053, (SCI).
  • Tseng, S. T.*, Chou, R. J., and Lee, S. P. (2002a), “A study of multivariate EWMA controller.” IIE Transactions, 34(6), 541-549, NSC 88-2218-M-007-007, (SCI).
  • Tseng, S. T.*, Chou, R. J., and Lee, S. P. (2002b), “Statistical design of double EWMA controller.” Applied Stochastic Models in Business and Industry, 18(3), 313-322. NSC 89-2218-M-007-018, (SCI).
  • Yu, H. F., and Tseng, S. T.* (2002), "Designing a screening experiment for highly reliable products." Naval Research Logistics, 49(5), 514-526, NSC 89-2218-M-007-019, (SCI).
  • Tseng, S. T.*, and Tang, J. (2001), "Optimal burn-in time for highly reliable products." International Journal of Industrial Engineering, 8(4), 329-338, NSC-87-2213-007-053, (SCI).
  • Tseng, S. T.*, and Wen, Z. C. (2000), "Step-stress accelerated degradation analysis of highly reliable products." Journal of Quality of Technology, 32(3), 209-216. NSC 87-2218-M-007-007, (SCI).
  • Yeh, R. H., Ho,W. D., and Tseng, S. T.* (2000), "Optimal production run length for products sold with warranty." European Journal of Operational Research, 120(3), 575-582, (SCI).

      B. 研討會論文 (Conference Papers)

  • Tseng, S. T. (2009), “Mis-specification analysis of linear degradation models,” 6-th International Conference on Simulation, St. Petersburg, June 28-July 4, Russia.
  • Tseng, S. T. (2009), “Optimal step-stress accelerated degradation test for gamma process”, MMR2009, Moscow, June 22-27, Russia.
  • Tseng, S. T. (2008), “Designing an efficient MEWMA controller”, ISBIS 2008, Prague, July 1-4.
  • Tseng, S. T. (2007), “Model mis-specification Analysis of Linear Degradation Models,” 56nd ISI International Conference, Lison, Portugal, August 22-29.
  • Tseng, S. T. (2006), “Stability Analysis of Single EWMA controller under Dynamic Systems,” INFORMS Meeting, Hong-Kong, June 25-28.
  • Tseng, S. T. (2005), “Determination the Sample Size for Achieving Stability of Double MEWMA Controller,” CSPS and IMS Joint Meeting, Beijing, July 9-12.
  • Tseng, S. T. (2004), "Reliability Improvement via Degradation Experiment," MMR2004 Conference, Santa Fe, USA, June 21-24.
  • Tseng, S. T. (2003), "An Enhanced Double EWMA Control Scheme," 54nd ISI International Conference, Berlin, Germany, August 13-20.
  • Tseng, S. T. (2003), "Optimal Variable EWMA Controller for a Drifted Process," 3nd International Symposium of Industrial Statistics, Barcelona, Spain, August 21-22.
  • Tseng, S. T. and Peng, C. Y. (2002), "Optimal burn-in time via stochastic integral" International Conference on Ranking and Selection, Multiple Comparisons, Reliability, and their Applications, Chennai, India, Dec. 28-30.
  • Yu, H. F. and Tseng, S. T.(2001), "Designing a screening experiment for highly reliable products," ISI International Conference, Seoul, Korea, August 23-28.
  • Tseng, S. T., Chou, R. J. and Lee, S. P. (2001), "Stability analysis of double EWMA controller," 2nd International Symposium of Industrial Statistics, Yokoyama, Japan, August,20-21.
  • Sun, C. I., Lee, S. P., Tseng, S. T., and Lo, Y. C. (2001), "Run by run feedback control for multiple products and multiple tools," 2nd International Symposium Industrial Statistics, Yokoyama, Japan, August,20-21.
  • Tseng, S. T. (2000), "Optimal burn-in procedure for highly-reliable products," 2nd International Conference of Mathematical methods of Reliability Theory, Bordeaux, France.

        C. 技術報告和其他 (Technical Reports and others)

  • 曾勝滄(2008)。「MIMO老化生產製程的穩健多變量 EWMA控制器之設計研究」, 國科會研究計劃 (NSC 97-2221-E-007-096-MY3)。
  • 曾勝滄(2007)。「多投入變數起始設定對 EWMA批次控制眾之影響」, 國科會研究計劃 (NSC 96-2221-E-007-038-MY3) 。
  • 曾勝滄(2007)。「衰變模型之誤判研究」, 國科會研究計劃 (NSC 96-2628-M-007-014-MY3) 。
  • 曾勝滄(2007)。「非線性衰變模型之研究」(3/3)，國科會研究計劃(NSC 95-2118-M-007-001)。
  • 曾勝滄(2007)。「Single EWMA控制器在動態系統下之穩定性研究」，國科會研究計劃 (NSC 95-2213-E-007-179)。
  • 曾勝滄(2006)。「非線性衰變模型之研究」(2/3)，國科會研究計劃(NSC 94-2118-2118-M-007-001)。
  • 曾勝滄(2006)。「Double EWMA 控制器穩定性質之研究」(3/3)，國科會研究計劃(NSC 94-2213-E-007-003)。
  • 曾勝滄(2005)。「非線性衰變模型之研究」(1/3)，國科會研究計劃(NSC 93-2118-M-007-008)。
  • 曾勝滄 (2005)。「Double EWMA 控制器穩定性質之研究」(2/3)，國科會研究計劃 (NSC 93-2213-E-007-028)。
  • 曾勝滄 (2004)。「Double EWMA 控制器穩定性質之研究」(1/3)，國科會研究計劃 (NSC 92-2213-E-007-066)。  
  • 曾勝滄 (2003)。「變動折扣因子控制器之研究」(3/3)，國科會研究計劃 (NSC 92-2218-M-007-010)。
  • 楊明城、李俊毅、詹韻玉、曾勝滄(2002)，「半導體製程」，中華民國專利證書發明第181901號，專利權期限（民國92年7月~115年5月）。
  • 曾勝滄 (2002)。「應用隨機積分決定高可靠度產品之最適Burn-in時間之研究」，國科會研究計劃成果報告 (NSC 91-2213-E-007-081)。
  • 曾勝滄 (2002)。「變動折扣因子控制器之研究」(2/3)，國科會研究計劃成果報告 (NSC 91-2218-M-007-002)。
  • 曾勝滄 (2001)。「高可靠度產品之壽命改善研究」(3/3)，國科會研究計劃成果報告 (NSC 89-2218-M-007-019)。
  • 曾勝滄 (2001)。「變動折扣因子控制器之研究」(1/3)，國科會研究計劃成果報告 (NSC 90-2218-M-007-009)。
  • 曾勝滄 (2000)。「Double EWMA 控制器之統計分析」(2/2)，國科會研究計劃成果報告 (NSC 89-2218-M-007-018)。
  • 曾勝滄 (2000)。「高可靠度產品之壽命改善研究」(2/3)，國科會研究計劃成果報告 (NSC 89-2218-M-007-005)。
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